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Nano Electronic Devices & Materials Laboratory
º» ¿¬±¸½Ç¿¡¼­´Â Â÷¼¼´ë ·ÎÁ÷ ¼ÒÀÚ, ¸Þ¸ð¸® ¼ÒÀÚ, ´º·Î¸ðÇÈ ¼ÒÀÚ ¹× ½Ã½ºÅÛ, 3Â÷¿ø ÁýÀû ¼ÒÀÚ ºÐ¾ß¿¡¼­ ´Ù¾çÇÑ ÀüÀÚ Àç·á, ¹ÝµµÃ¼ °øÁ¤ ¹× ºÐ¼®À» Ȱ¿ëÇÏ¿© ¿¬±¸¸¦ ¼öÇàÇϰí ÀÖ½À´Ï´Ù. Àç·áÀÇ ¹°¸®/È­ÇÐÀû Ư¼ºÀ» ÀÌÇØÇϰí À̸¦ ¹ÙÅÁÀ¸·Î ¹ÝµµÃ¼ ¼ÒÀÚ¸¦ Á¦ÀÛÇϰí Àü±â/±¤ÇÐ/È­ÇÐ/¹°¸®ÀûÀΠƯ¼ºÀ» ºÐ¼®/ÇØ¼®ÇÕ´Ï´Ù.

Our research activities consist of material, process, device and characterization for various advanced semiconductor devices in logic, memory, neuromorphic and monolithic 3D integration.

Recent News more

  • 2026 KCS ÇÐȸ Âü¼® ¹× ¹ßÇ¥
    2026-02-11
  • 2026 NCC ÇÐȸ Âü¼® (±èµ¿¿í, ¼­°­¹é, ÀåÇØ¼ö, Á¤Àç¿ø, ÃÖÁöÈÆ)
    2026-02-10

Gallery more

  • Farewell 2025, NEDML: End of Chapter, Adios!
    2026-01-13
  • 2026 º´¿À³â »õÇØ
    2026-01-05

Journal more

  • Chanseul Lee, Sunbum Kim, Gyulee Kim, Minhyuk Kim, Yongjoo Park, and Changhwan Choi*, "Material and Electrical Characteristics of Thin Film Transistor using Cationic Composition Controlled Atomic Layer Deposited In-Ga-Sn-O (IGTO) Thin Film", accepted, ACS Applied Electronic Materials,, 2026

Conference more

  • Dohyun Lee, Yunseo Lim, Jisu Park, Gyumin Hwang, Sangmyun Lim, Seongho Lee, JinYeong Lee, Hoon Pyo and Changhwan Choi*, "Impact of Crystallization on Trap Levels and Charge Storage Characteristics of High-k HfO©ü Charge Trap Layers for 3D NAND Flash Memory Device", 33ȸ Çѱ¹¹ÝµµÃ¼Çмú´ëȸ (KCS), Á¤¼± ÇÏÀÌ¿ø ±×·£µå È£ÅÚ, 2026.01